Focused ion beam

Results: 158



#Item
41Fraunhofer-Institut für Z u v e r l ä s s i g k e i t u n d M i k r o i n t e g r at i o n I Z M Focused Ion Beam EMV-Messkammer

Fraunhofer-Institut für Z u v e r l ä s s i g k e i t u n d M i k r o i n t e g r at i o n I Z M Focused Ion Beam EMV-Messkammer

Add to Reading List

Source URL: www.izm.fraunhofer.de

Language: German - Date: 2015-05-05 14:10:35
    42Resources Available to NU-ACCESS Staff and Participants Northwestern University Sample Preparation • Optical Microscopy and Metallography http://omm.facilities.northwestern.edu/ The OMM is equipped for sample preparati

    Resources Available to NU-ACCESS Staff and Participants Northwestern University Sample Preparation • Optical Microscopy and Metallography http://omm.facilities.northwestern.edu/ The OMM is equipped for sample preparati

    Add to Reading List

    Source URL: www.nuaccess.northwestern.edu

    Language: English - Date: 2014-05-03 23:30:03
    43Engineer – Electronic Design

    Engineer – Electronic Design

    Add to Reading List

    Source URL: www.wdc.com

    Language: English - Date: 2011-01-05 18:58:34
    44SEM Technology Advances Energy Research

    SEM Technology Advances Energy Research

    Add to Reading List

    Source URL: www.jeolusa.com

    Language: English - Date: 2013-07-31 11:10:02
    45THE UNIVERSITY OF TENNESSEE  Department of Materials Science and Engineering 414F Ferris Engineering Building 1508 Middle Drive Knoxville, Tennessee

    THE UNIVERSITY OF TENNESSEE Department of Materials Science and Engineering 414F Ferris Engineering Building 1508 Middle Drive Knoxville, Tennessee

    Add to Reading List

    Source URL: www.aesj.or.jp

    Language: English - Date: 2015-02-23 03:58:14
    46Microsoft Word - WITec_TESCAN_PressRelease_Prism_Award_2015_RISE_feb2015_EN.doc

    Microsoft Word - WITec_TESCAN_PressRelease_Prism_Award_2015_RISE_feb2015_EN.doc

    Add to Reading List

    Source URL: www.witec.de

    Language: English - Date: 2015-02-19 11:59:09
    47Get 5 TEM sections made from your samples using FIB – ideal for orientation imaging and strain solutions at 1-5 nm resolution using ASTAR/Digistar/Topspin/Autostrain. TEM sections can be machined from the top surface o

    Get 5 TEM sections made from your samples using FIB – ideal for orientation imaging and strain solutions at 1-5 nm resolution using ASTAR/Digistar/Topspin/Autostrain. TEM sections can be machined from the top surface o

    Add to Reading List

    Source URL: www.nanomegas.com

    Language: English - Date: 2014-09-02 15:58:01
    48

    PDF Document

    Add to Reading List

    Source URL: www.jetro.go.jp

    Language: English - Date: 2014-12-26 02:52:01
    49Biogeosciences, 12, 825–834, 2015 www.biogeosciences.netdoi:bg © Author(sCC Attribution 3.0 License.  Insight into Emiliania huxleyi coccospheres by focused ion beam

    Biogeosciences, 12, 825–834, 2015 www.biogeosciences.netdoi:bg © Author(sCC Attribution 3.0 License. Insight into Emiliania huxleyi coccospheres by focused ion beam

    Add to Reading List

    Source URL: www.biogeosciences.net

    Language: English - Date: 2015-02-11 02:30:02
    50egu_logo_without_circle_grey

    egu_logo_without_circle_grey

    Add to Reading List

    Source URL: www.biogeosciences.net

    Language: English - Date: 2014-12-03 14:56:39